28 September 2011

Accel-RF announces university collaboration program for GaN RF reliability test

Accel-RF Corp of San Diego, CA, USA, which produces turn-key RF reliability testing systems for compound semiconductor devices, has announced a university collaboration program that involves providing universities with RF equipment, software and other services for the reliability testing and characterization of compound semiconductor devices such as gallium nitride (GaN). The goal is for professors and their research teams to use these resources for research into compound semiconductor RF physics, reliability prediction, and test method improvement.

“Accel-RF is pleased to support our participating universities by providing leading-edge reliability test equipment to a team of researchers,” says president & founder Roland Shaw. “Our equipment, software and support engineering services allow researchers and manufacturers to collect in-situ performance degradation data on RF/microwave devices, and use that data to move forward the understanding of reliability drivers in advanced semiconductor technologies,” he adds.

The university collaboration program bolsters Accel-RF’s Cooperative Research and Development Agreement (CRADA) with the US Air Force Research Laboratory (AFRL) announced in August 2010.

“The relationship between Accel-RF and our academic partners has and continues to be a win-win situation,” says Shaw. “The work already completed has born insights into development of more rugged GaN transistor technology that can be deployed in many applications throughout the semiconductor industry,” he adds.

Tags: Accel-RF GaN RF reliability test

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